LMP8601EDRQ1

Texas Instruments
595-LMP8601EDRQ1
LMP8601EDRQ1

製造商:

說明:
電流感應放大器 AEC-Q100 -22 to 60V bi-directional cur

ECAD模型:
下載免費的庫載入器,為ECAD工具轉換此文件。瞭解更多關於 ECAD 型號的資訊。

庫存量: 6,651

庫存:
6,651 可立即送貨
工廠前置作業時間:
6 週 工廠預計生產時間數量大於所顯示的數量。
最少: 1   多個: 1
單價:
NT$-.--
總價:
NT$-.--
估計關稅:
包裝:
完整捲(訂購多個2500)

Pricing (TWD)

數量 單價
總價
零卷 / MouseReel™
NT$185.40 NT$185.40
NT$141.48 NT$1,414.80
NT$130.68 NT$3,267.00
NT$118.44 NT$11,844.00
NT$112.68 NT$28,170.00
NT$109.44 NT$54,720.00
NT$106.56 NT$106,560.00
完整捲(訂購多個2500)
NT$103.32 NT$258,300.00
5,000 報價
† NT$215.00 MouseReel™費用將加入您的購物車內並自動計算。所有MouseReel™訂單均不能取消和不能退換。

商品屬性 屬性值 選擇屬性
Texas Instruments
產品類型: 電流感應放大器
RoHS:  
LMP8601
1 Channel
- 22 V to 60 V
90 dB
150 uV
5.5 V
3 V
1 mA
- 40 C
+ 150 C
SMD/SMT
SOIC-8
AEC-Q100
Reel
Cut Tape
MouseReel
放大器類型: High-Side Current Sense Amplifier
品牌: Texas Instruments
組裝國家: Not Available
擴散國: Not Available
原產國: MY
產品: Current Sense Amplifiers
產品類型: Current Sense Amplifiers
原廠包裝數量: 2500
子類別: Amplifier ICs
每件重量: 158.800 mg
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所選屬性: 0

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CNHTS:
8542339000
CAHTS:
8542330000
USHTS:
8542330001
MXHTS:
8542330299
ECCN:
EAR99

LMP860x/LMP860x-Q1 60V Current Sensing Amplifiers

Texas Instruments LMP860x/LMP860x-Q1 60V Fixed Gain Current Sensing Precision Amplifiers amplify and filter small differential signals in the presence of high common-mode voltages. The input common-mode voltage range of these devices is -22V to +60V when operating from a single 5V supply. With a 3.3V supply, the input common-mode voltage range is from -4V to +27V. Texas Instruments LMP860x/LMP860x-Q1 fixed gain current sensing precision amplifiers are members of the LMP® family and are ideal for use in unidirectional and bidirectional current sensing applications. The LMP8602/LMP8602-Q1 has a precise gain of 50x, while the LMP8603/LMP8603-Q1 has a precise gain of 100x. These precise gain figures can drive an ADC to its full-scale value in most targeted applications. The LMP8602-Q1 and LMP8603-Q1 incorporate enhanced manufacturing and support processes for the automotive market, including defect detection methodologies.